Number of the records: 1
Kelvin probe force microscopy
- 1.0501462 - FZÚ 2019 RIV CH eng M - Monography Chapter
Ondráček, Martin - Hapala, Prokop - Švec, Martin - Jelínek, Pavel
Imaging charge distribution within molecules by scanning probe microscopy.
Kelvin probe force microscopy. Cham: Springer International Publishing, 2018 - (Sadewasser, S.; Glatzel, T.), s. 499-518. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8
R&D Projects: GA ČR GJ17-24210Y
Grant - others:AV ČR(CZ) Praemium Academiae
Institutional support: RVO:68378271
Keywords : charge distribution * surfaces * molecules * Kelvin probe force microscopy * scanning quantum dot microscopy * high resolution atomic force microscopy
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Different methods which provide information about charge distribution at atomic or submolecular scale are discussed, including Kelvin probe force microscopy, scanning quantum dot microscopy or high-resolution imaging with functionalized tips.
Permanent Link: http://hdl.handle.net/11104/0293485
Number of the records: 1