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Correlative imaging using CL and STEM detector in a SEM
- 1.0501297 - ÚPT 2019 CZ eng A - Abstract
Skoupý, Radim - Krzyžánek, Vladislav
Correlative imaging using CL and STEM detector in a SEM.
Mikroskopie 2018. Praha: Československá mikroskopická společnost, 2018. s. 26.
[Mikroskopie 2018. 14.05.2018-16.05.2018, Lednice na Moravě]
R&D Projects: GA ČR GA17-15451S; GA TA ČR TG03010046; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : correlative imaging * STEM * SEM
OECD category: Electrical and electronic engineering
Nowadays, a correlative imaging is one of the main topics in the field of electron microscopy, because it enables to study a sample from different points of view by comparing several different signale induced by incident primary electron beam.
Permanent Link: http://hdl.handle.net/11104/0293289
Number of the records: 1