Perspective scintillation electron detectors for S(T)EM

0495554 - ÚPT 2019 AU eng A - Abstract
Schauer, Petr - Lalinský, Ondřej - Kučera, M. … Total 4 authors
Perspective scintillation electron detectors for S(T)EM.
19th International Microscopy Congress (IMC19). Book of Abstracts.. Sydney: LMA, 2018.
[International Microscopy Congress (IMC19) /19./. 09.09.2018-14.09.2018, Sydney]
R&D Projects: GA ČR(CZ) GA16-05631S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
OECD category: Electrical and electronic engineering

Any detector is valuable if it doesn't waste the collected signal, doesn't introduce noise, and its response is sufficiently fast. The important indicator of an image quality is the modulation transfer function (MTF) which describes the ability to show fine image details. Using a scanning imaging system with a scintillation electron detector, the detector bandwidth, which is given especially by the scintillator time response, is the key to the good MTF. Not less important parameters are those affecting the detective quantum efficiency (DQE) which is primarily a measure of image noise. Efficient components with the high bandwidth and dynamic range are the key to the high DQE. To find the neck of a scintillation detection system, one must examine the whole detection path step by step. In fact, only three parameters of currently used standard scintillation electron detectors for S(T)EM can be referred as weaknesses of the system. These are scintillator conversion efficiency, scintillator time response and photon collection efficiency. Unfortunately, there is no great chance to improve the conversion efficiency, because the values for garnet scintillators are close to the theoretical limit. The other two parameters have prospects of improvement.
Permanent Link: http://hdl.handle.net/11104/0288509