Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer

0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

The inelastic mean free path (IMFP) is a key parameter of electron transport in a solid. With
the rise of so-called meta-materials, materials of specific shape, such as 2D crystals, or
materials with tailored functionality for next-generation electronic devices, the investigation
of the IMFP is still topical and of high importance. This is true especially at low energies, landing energy of electrons below 100 eV, that are hard to study using well established
techniques of electron spectroscopy.
Permanent Link: http://hdl.handle.net/11104/0287642