Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations

0493331 - ÚPT 2019 US eng A - Abstract
Mikmeková, Eliška - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Daniel, Benjamin - Konvalina, Ivo - Řiháček, Tomáš - Zouhar, Martin - Zaporozchenko, A. - Lejeune, M.
Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations.
Microscopy and Microanalysis. Cambridge University Press. Roč. 24, S1 (2018), s. 1564-1565. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low and ultra-low energy * SEM * 2D transition metal dichalcogenides * experiments and simulations
OECD category: Nano-materials (production and properties)

Two-dimensional (2D) materials have attracted huge interest since isolating of free-standing graphene. The reason is their interesting properties and promising potential applications. Scanning electron microscopy with slow and very slow electrons offers an innovative tool enabling to study 2D materials in detail. In order to examine mutually overlapped flakes of two-dimensional crystals such as 2D transition metal dichalcogenides with an electron microscope we need to obtain a contrast contribution from a single layer of atoms. This task requires increasing the scattering rate of incident electrons by means of a drastic lowering of their energy to hundreds of eV or less.
Permanent Link: http://hdl.handle.net/11104/0286714