Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma

0491193 - ÚJF 2019 RIV FR eng C - Conference Paper (international conference)
Torrisi, L. - Costa, G. - Ceccio, G. - Cannavo, A. - Restuccia, N. - Cutroneo, Mariapompea
Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma.
EPJ Web of Conferences. Vol. 167. Les Ulis: EDP Sciences, 2018, č. článku 03011. ISSN 2101-6275.
[8th International Conference on Plasma Physics by Laser and Applications (PPLA 2017). Messina (IT), 05.07.2017-07.07.2017]
R&D Projects: GA MŠMT LM2015056; GA MŠMT EF16_013/0001812
Institutional support: RVO:61389005
Keywords : laser-generated plasma * spectrometers * TOF
OECD category: Nuclear physics

The pulsed laser-generated plasma in vacuum and at low and high intensities can be characterized using different physical diagnostics. The charge particles emission can be characterized using magnetic, electric and magnet-electrical spectrometers. Such on-line techniques are often based on time-of-flight (TOF) measurements. A 90° electric deflection system is employed as ion energy analyzer (IEA) acting as a filter of the mass-to-charge ratio of emitted ions towards a secondary electron multiplier. It determines the ion energy and charge state distributions. The measure of the ion and electron currents as a function of the mass-to-charge ratio can be also determined by a magnetic deflector spectrometer, using a magnetic field of the order of 0.35 T, orthogonal to the ion incident direction, and an array of little ion collectors (IC) at different angles. A Thomson parabola spectrometer, employing gaf-chromix as detector, permits to be employed for ion mass, energy and charge state recognition. Mass quadrupole spectrometry, based on radiofrequency electric field oscillations, can be employed to characterize the plasma ion emission. Measurements performed on plasma produced by different lasers, irradiation conditions and targets are presented and discussed. Complementary measurements, based on mass and optical spectroscopy, semiconductor detectors, fast CCD camera and Langmuir probes are also employed for the full plasma characterization. Simulation programs, such as SRIM, SREM, and COMSOL are employed for the charge particle recognition.
Permanent Link: http://hdl.handle.net/11104/0285240