Calibration of imaging plates to electrons between 40 and 180 MeV

0488214 - FZÚ 2018 RIV US eng J - Journal Article
Rabhi, N. - Boháček, Karel - Batani, D. - Boutoux, G. - Ducret, J. E. - Guillaume, E. - Jakubowska, K. - Thaury, C. - Thfoin, I.
Calibration of imaging plates to electrons between 40 and 180 MeV.
Review of Scientific Instruments. Roč. 87, č. 5 (2016), s. 1-9, č. článku 053306. ISSN 0034-6748. E-ISSN 1089-7623
R&D Projects: GA MŠMT EF15_008/0000162; GA MŠMT LQ1606; GA ČR GA15-03118S
Grant - others:ELI Beamlines(XE) CZ.02.1.01/0.0/0.0/15_008/0000162
Institutional support: RVO:68378271
Keywords : rays * calibration process * energy spectra * GEANT4 simulation
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.515, year: 2016

This paper presents the response calibration of Imaging Plates (IPs) for electrons in the 40-180 MeV range using laser-accelerated electrons at Laboratoire d'Optique Appliquee (LOA), Palaiseau, France. In the calibration process, the energy spectrum and charge of electron beams are measured by an independent system composed of a magnetic spectrometer and a Lanex scintillator screen used as a calibrated reference detector. It is possible to insert IPs of different types or stacks of IPs in this spectrometer in order to detect dispersed electrons simultaneously. The response values are inferred from the signal on the IPs, due to an appropriate charge calibration of the reference detector. The effect of thin layers of tungsten in front and/or behind IPs is studied in detail. GEANT4 simulations are used in order to analyze our measurements. Published by AIP Publishing.
Permanent Link: http://hdl.handle.net/11104/0282813