0481772 - FZÚ 2018 RIV US eng J - Journal Article
Kopeček, Jaromír - Jurek, Karel - Kopecký, Vít - Klimša, Ladislav - Seiner, Hanuš - Sedlák, Petr - Landa, Michal - Dluhoš, J. - Petrenec, M. - Hladík, L. - Doupal, A. - Heczko, Oleg
Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl.
Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR(CZ) GA14-03044S
Institutional support: RVO:68378271 ; RVO:61388998
Keywords : scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 1.872, year: 2014 ; AIS: 0.793, rok: 2014
DOI: https://doi.org/10.1017/S1431927614003390

The presented article reviews the first experiences with the xenon plasma focused ion beam (FIB) in the scanning electron microscope (SEM) applied on the investigations of shape memory alloys (SMAs). The SMA are the focus of investigation in our department for many years and these investigated alloys are examples of material prepared by novel spark plasma sintering method (NiTi) and traditional metallurgical method (CoNiAl). Thus apart of basic characterization it also facilitates the comparison between two different methods of preparation.
Permanent Link: http://hdl.handle.net/11104/0277259