More features, more tools, more CrysTBox

0479945 - FZÚ 2018 RIV GB eng J - Journal Article
Klinger, Miloslav
More features, more tools, more CrysTBox.
Journal of Applied Crystallography. Roč. 50, Part 4 (2017), s. 1226-1234. ISSN 0021-8898. E-ISSN 1600-5767
R&D Projects: GA ČR GBP108/12/G043
Institutional support: RVO:68378271
Keywords : electron diffraction * automated analysis * transmission electron-microscopy * high-resolution transmission electron microscopy * visualization
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 3.422, year: 2017

A new release of the CrysTBox software is introduced. The original toolbox allows for an automated analysis of transmission electron microscope (TEM)images and for crystallographic visualization. The existing tools, which are capable of highly precise analyses of high-resolution TEM images, as well as spot, disc and ring diffractio patterns, are extended to include a tool for automatically measuring TEM sample thickness using convergent beam electron diffraction in a two-beam approximation. An implementation of geometric phase analysis is newly available, employing one of the existing tools to identify parameters and indices of crystallographic planes depicted in the input image and allowing easier and more accurate analysis.

Permanent Link: http://hdl.handle.net/11104/0275859