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Lead-silicate glass surface sputtered by an argon cluster ion beam investigated by XPS

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    0479273 - FZÚ 2018 RIV NL eng J - Journal Article
    Zemek, Josef - Jiříček, Petr - Houdková, Jana - Jurek, Karel - Gedeon, O.
    Lead-silicate glass surface sputtered by an argon cluster ion beam investigated by XPS.
    Journal of Non-Crystalline Solids. Roč. 469, Aug (2017), s. 1-6. ISSN 0022-3093. E-ISSN 1873-4812
    R&D Projects: GA MŠMT LM2015088; GA ČR(CZ) GA15-12580S
    Institutional support: RVO:68378271
    Keywords : lead-silicate glass * XPS * BO * NBO * Argon duster ion beam sputtering * X-ray irradiation
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
    Impact factor: 2.488, year: 2017

    We apply Ar cluster ion beam sputtering, known as a very gentle technique with respect to the changes in surface chemistry, to air-exposed lead-silicate glass surfaces analyzed by high-energy resolved core-level photoelectron spectroscopy.
    Permanent Link: http://hdl.handle.net/11104/0275276

     
     
Number of the records: 1  

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