Direct imaging of dopant distribution in polycrystalline ZnO films

0474081 - FZÚ 2018 RIV US eng J - Journal Article
Lorenzo, F. - Aebersold, A.B. - Morales-Masis, M. - Ledinský, Martin - Escrig, S. - Vetushka, Aliaksi - Alexander, D.T.L. - Hessler-Wyser, A. - Fejfar, Antonín - Hébert, C. - Nicolay, S. - Ballif, C.
Direct imaging of dopant distribution in polycrystalline ZnO films.
ACS Applied Materials and Interfaces. Roč. 9, č. 8 (2017), s. 7241-7248. ISSN 1944-8244. E-ISSN 1944-8252
R&D Projects: GA ČR GC16-10429J
Institutional support: RVO:68378271
Keywords : dopant distribution * film polarity * grain boundaries * NanoSIMS * polycrystalline film * zinc oxide
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 8.097, year: 2017

Two fundamental requirements of transparent conductive oxides are high conductivity and low optical absorptance, properties strongly dependent on the free-carrier concentration of the film. The free-carrier concentration is usually tuned by the addition of dopant atoms, which are commonly assumed to be uniformly distributed in the films or partially segregated at grain boundaries. Here, the combination of secondary ion mass spectroscopy at the nanometric scale (NanoSIMS) and Kelvin probe force microscopy (KPFM) allows direct imaging of boron-dopant distribution in polycrystalline zinc oxide (ZnO) films. This work demonstrates that the boron atoms have a bimodal spatial distribution within each grain of the ZnO films. NanoSIMS analysis shows that boron atoms are preferentially incorporated into one of the two sides of each ZnO grain. KPFM measurements confirm that boron atoms are electrically active, locally increasing the free-carrier concentration in the film.
Permanent Link: http://hdl.handle.net/11104/0271192