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First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system

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    0471582 - FZÚ 2017 RIV US eng C - Conference Paper (international conference)
    Krůs, Miroslav - Levato, Tadzio - Kim, H. T. - Grittani, Gabriele Maria - Margarone, Daniele - Jeong, Tae Moon - Mocek, Tomáš - Korn, Georg
    First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system.
    Research Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II. Bellingham: SPIE, 2015 - (Korn, G.; Silva, L.), s. 1-9, č. článku 95151K. Proceedings of SPIE, 9515. ISBN 978-1-62841-636-7. ISSN 0277-786X.
    [Research Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II. Praha (CZ), 13.04.2015-15.04.2015]
    R&D Projects: GA MŠMT EE2.3.20.0279; GA MŠMT ED1.1.00/02.0061
    Grant - others:ELI Beamlines(XE) CZ.1.05/1.1.00/02.0061; LaserZdroj (OP VK 3)(XE) CZ.1.07/2.3.00/20.0279
    Institutional support: RVO:68378271
    Keywords : laser wakefield acceleration * transverse emittance measurement
    Subject RIV: BL - Plasma and Gas Discharge Physics

    The quadrupole lens free multiple profile emittance measurement method is an adaptation of the standard multiple profile monitor method for electron beam emittance measurement which was tested at PW laser system. This single shot technique allows to obtain the emittance from beam profile radii fit by means of Twiss (Courant-Snyder) parameters.
    Lanex scintillating screens were used as profile monitors due to their high yield of visible photons. However, on the other hand, the screen is a source of multiple Coulomb scattering which can influence the beam profile on the followingscreens at relatively low electron energies.
    Permanent Link: http://hdl.handle.net/11104/0268968

     
     
Number of the records: 1  

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