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Temperature dependent mass loss of Epon resin sections, p 56 Keywords: Epon resin, mass loss, radiation damage, low voltage STEM, temperature
- 1.0466095 - ÚPT 2017 CZ eng A - Abstract
Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Temperature dependent mass loss of Epon resin sections, p 56 Keywords: Epon resin, mass loss, radiation damage, low voltage STEM, temperature.
Mikroskopie 2016. Praha: Československá mikroskopická společnost, 2016. s. 56.
[Mikroskopie 2016. 03.05.2016-04.05.2016, Lednice]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : epon resin * mass loss * radiation damage * low voltage STEM * temperature
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering; JA - Electronics ; Optoelectronics, Electrical Engineering (BC-A)
A scanning transmission electron microscope (STEM) is a useful device combining features of scanning and transmission electron microscopes.
Permanent Link: http://hdl.handle.net/11104/0264506
Number of the records: 1