Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass

0458106 - FZÚ 2016 RIV CZ eng V - Research Report
Vaněček, Milan - Holovský, Jakub - Poruba, Aleš - Remeš, Zdeněk - Purkrt, Adam
Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass.
Praha: Tel Solar AG, Trübbach, Switzerland, 2015. 22 s.
Source of funding: N - Non-public resources
Keywords : optical properties * amorphous silicon * microcrystalline silicon * ZnO
Subject RIV: BM - Solid Matter Physics ; Magnetism

Optical and photoelectrical properties of materials from TEL Solar were characterized in the Institute of Physics, AS CR in a broad spectral region and a high dynamic range. Conclusions on material properties with respect to thin film silicon solar cells were drawn.
Permanent Link: http://hdl.handle.net/11104/0258426