Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy

0452915 - FZÚ 2016 RIV JP eng J - Journal Article
Müller, Martin - Hývl, Matěj - Kratzer, M. - Teichert, C. - Misra, S. - Foldyna, M. - Yu, L. - Roca i Cabarrocas, P. - Itoh, T. - Hájková, Zdeňka - Vetushka, Aliaksi - Ledinský, Martin - Kočka, Jan - Fejfar, Antonín
Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy.
Japanese Journal of Applied Physics. Roč. 54, č. 8 (2015), "08KA08-1"-"08KA08-5". ISSN 0021-4922. E-ISSN 1347-4065
R&D Projects: GA ČR GA14-15357S; GA MŠMT(CZ) 7AMB14ATE004; GA ČR GA13-25747S; GA ČR GA13-12386S; GA MŠMT(CZ) LM2011026; GA ČR GB14-37427G
Grant - others:AVČR(CZ) M100101217
Institutional support: RVO:68378271
Keywords : solar cells * radial junctions * silicon nanowires * correlative microscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.122, year: 2015

Solar cells with radial junctions based on silicon nanowires were investigated using correlative microscopy to determine the nature of previously reported inhomogeneity of their electronic properties. For correlation, we have prepared sets of three Vickers nanoindents arranged in a right triangle with 20 µm sides as marks of local frame of reference. Due to the shape of the indents (squares with 4 µm sides and clear diagonals) the position of the marks can be located with high precision by various microscopes. This enabled us to correlate the results from scanning electron microscopy, Kelvin probe force microscopy and conductive atomic force microscopy techniques on the same place of the sample, with a precision down to individual nanowires, obtaining new information about the electronic inhomogeneity. Using the conductive AFM we analyzed the growth process of silicon nanowires step by step in order to find possible origins of the local (photo)current variations.
Permanent Link: http://hdl.handle.net/11104/0253810