Field emission as a tool for characterization of HOPG surface

0452389 - ÚPT 2016 SK eng A - Abstract
Knápek, Alexandr - Sobola, D. - Tománek, P. - Pokorná, Zuzana - Jelínek, P.
Field emission as a tool for characterization of HOPG surface.
SURFINT-SREN IV. Progress in Applied Surface, Interface and Thin Film Science 2015. Extended Abstract Book. Bratislava: Comenius University Bratislava, 2015. s. 74. ISBN 978-80-223-3975-9.
[SURFINT-SREN /4./. Progress in Applied Surface, Interface and Thin Film Science 2015. 23.11.2015-26.11.2015, Florence]
Institutional support: RVO:68081731
Keywords : field emission * HOPG surface

This paper deals with the electrical characterization of HOPG surface based on field emission of electrons. The effect of field emission occurs only at disrupted surface, i. e. surface containing ripped and warped shreds of the graphene layer. These deformations provide the necessary field gradients which are required for measuring tunneling current caused by field electron emission. Results of the field emission measurements are correlated with other surface characterization methods such as scanning near-field optical microscopy (SNOM) or Raman spectroscopy.
Permanent Link: http://hdl.handle.net/11104/0253458