Electron beam induced mass loss dependence on aging of Epon resin sections

0452276 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, Jana
Electron beam induced mass loss dependence on aging of Epon resin sections.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * mass loss * resin * Epon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

It has been recently shown that low voltage STEM (Scanning Transmission Electron Microscope) can be regarded as the method of choice for many studies of biological samples. Main advantage of this technique is that it allows one to image samples with low contrast. Usually, in a standard STEM (typical acceleration voltage 60–300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). This is not necessarily in low voltage STEM. Consequently, investigated structures are closer to native state of investigated samples. During sample preparation biological material is embedded in a resin which is observed in microscope in a form of ultrathin sections. There is commercially available wide spectrum of resins with different properties for embedding samples in a range from soft tissues to bones. They have various parameters such as hardness, mechanical stability, penetrability. For imaging an important parameter is a sensitivity to degradation by electron beam.
Permanent Link: http://hdl.handle.net/11104/0253305