Number of the records: 1
Automated CBED processing: sample thickness estimation based on analysis of zone-axis CBED pattern
- 1.0448141 - FZÚ 2016 RIV NL eng J - Journal Article
Klinger, Miloslav - Němec, Martin - Polívka, Leoš - Gärtnerová, Viera - Jäger, Aleš
Automated CBED processing: sample thickness estimation based on analysis of zone-axis CBED pattern.
Ultramicroscopy. Roč. 150, Mar (2015), s. 88-95. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA ČR GBP108/12/G043
Institutional support: RVO:68378271
Keywords : TEM * CBED * thickness estimation * zone axis * computer vision * automatization
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.874, year: 2015
An automated processing of convergent beam electron diffraction (CBED) patterns is presented. The proposed methods are used in an automated tool for estimating the thickness of transmission electron microscopy (TEM) samples.
Permanent Link: http://hdl.handle.net/11104/0249867
Number of the records: 1