Utilization of dual-source X-ray tomography for reduction of scanning time of wooden samples

0444421 - ÚTAM 2016 RIV GB eng J - Journal Article
Fíla, Tomáš - Kumpová, Ivana - Jandejsek, Ivan - Kloiber, Michal - Tureček, D. - Vavřík, Daniel
Utilization of dual-source X-ray tomography for reduction of scanning time of wooden samples.
Journal of Instrumentation. Roč. 10, č. 5 (2015), C05008. ISSN 1748-0221. E-ISSN 1748-0221.
[International workshop on radiation imaging detectors. Trieste, 22.06.2014-26.06.2014]
R&D Projects: GA MK(CZ) DF11P01OVV001
Keywords : computerized tomography (CT) * computed radiography (CR) * overall mechanics design * inspection with X-rays
Subject RIV: AL - Art, Architecture, Cultural Heritage
Impact factor: 1.310, year: 2015
http://iopscience.iop.org/article/10.1088/1748-0221/10/05/C05008

We present a novel dual-source/dual energy (DSCT/DECT) micro-tomography system including results of high-resolution DSCT reconstruction. The DSCT micro-tomography setup was designed as a multi-purpose X-ray imaging device equipped with two pairs of X-ray tubes and detectors in orthogonal arrangement with independent control of beam parameters. Both pairs (tube-detector) are mounted on a computer numerical control positioning system and can be independently set up to different geometries (e.g. with different magnification of each pair). In this work the simultaneous scanning of the object by two tube-detector pairs was used for approximately half reduction of tomography scanning time. The developed imaging procedure was applied for scanning of a wooden sample locally damaged during a semi-destructive test for assessment of wood quality. Prior to the tomography measurements the setup geometry was precisely adjusted in terms of magnification, horizontal and vertical tube-specimen-detector alignment of both pairs. DSCT measurements were carried out in sequence (2 x90 ° for each tube) with identical 100μm image resolution. It was proven that the presented experimental setup combined with appropriate control technique significantly reduces tomography scanning time of materials with complex micro-structure.
Permanent Link: http://hdl.handle.net/11104/0246946