Number of the records: 1  

Particle-in-cell Simulations of Flush-Mounted Probes

  1. 1.
    0436704 - ÚFP 2015 RIV FR eng C - Conference Paper (international conference)
    Podolník, Aleš - Komm, Michael - Dejarnac, Renaud - Pánek, Radomír - Gunn, J. P.
    Particle-in-cell Simulations of Flush-Mounted Probes.
    EPS2014:41st EPS Conference on Plasma Physics. Vol. 38F. Mulhouse: European Physical Society, 2014 - (Ratynskaia, S.; Mantica, P.; Benuzzi-Mounaix, A.; Dilecce, G.; Bingham, R.; Hirsch, M.; Kemnitz, B.; Klinger, T.), P1.041-P1.041. Europhysics Conference Abstracts (ECA). ISBN 2-914771-90-8.
    [EPS Conference on Plasma Physics/41./. Berlin (DE), 23.06.2014-27.06.2014]
    R&D Projects: GA ČR GAP205/11/2341
    Institutional support: RVO:61389021
    Keywords : Flush probe * I-V characteristics * simulation * Particle-in-cell
    Subject RIV: BL - Plasma and Gas Discharge Physics
    http://ocs.ciemat.es/EPS2014PAP/pdf/P1.041.pdf

    In order to investigate plasma properties in the scrape-off layer, flush-mounted probes are frequently used in divertors or limiters. However, the presence of the magnetic field causes significant effects on the acquired I-V characteristics. This influence can be studied using Particle-in-Cell simulations. In this study, we use a cartesian 2D3V PIC code SPICE2 code to examine the dependencies of I-V characteristics on magnetic field grazing angle and magnitude and to relate them to known plasma parameters. Both flat and rounded probe tip geometry are investigated in the wide range of incident field line angles using the probe geometry based on the dedicated HFS limiter used on COMPASS tokamak. The I-V characteristics are analysed using a standard 3-parameter and 4-parameter procedures and the yielded values of Te and density are compared to input parameters. A semi-empirical rule for the slope of ion current is derived and can be used in analysis of experimental data.
    Permanent Link: http://hdl.handle.net/11104/0240372

     
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.