Using environmental scanning electron microscopy (ESEM) as a non-invasive method to studying fixed parasites

0434114 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Mašová, Šárka - Neděla, Vilém - Tihlaříková, Eva
Using environmental scanning electron microscopy (ESEM) as a non-invasive method to studying fixed parasites.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : parasites * ESEM * taxonomy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Scanning electron microscopy (SEM) is popular and for taxonomy of parasites very important and not substituted method in many times. However sometimes taxonomists have only one specimen and cannot use classical SEM, because their sample (poor conductor) have to be fixed, dehydrated and coated before it can be observed. This method condemns samples for destroying and do not allow other using of it, e.g. for molecular study or depositing as type material in museum. Moreover, the specimen preparation is often long and slow. Environmental scanning electron microscopy (ESEM) brings two main advantages: elimination of speed of sample preparation and non-invasivity.
Permanent Link: http://hdl.handle.net/11104/0238250