Apparatus for temperature-dependent cathodoluminescence characterization of materials

0430353 - ÚPT 2015 RIV GB eng J - Journal Article
Bok, Jan - Schauer, Petr
Apparatus for temperature-dependent cathodoluminescence characterization of materials.
Measurement Science and Technology. Roč. 25, č. 7 (2014), 075601:1-7. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA TA ČR TE01020118; GA ČR(CZ) GA14-20012S
Institutional support: RVO:68081731
Keywords : cathodoluminescence * electron beam * cryostat * scintillator * YAG:Ce
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.433, year: 2014

An apparatus for characterization of temperature-dependent cathodoluminescence (CL) of solid-state materials is presented. This device excites a specimen using an electron beam and the CL emission is collected from the specimen side opposite the e-beam irradiation. The design of the temperature-controlled specimen holder that enables cooling down to 100 K and heating up to 500 K is described. The desired specimen temperature is automatically stabilized using a PID controller, which is the proportional-integral-derivative control feedback loop. Moreover, the specimen holder provides in situ e-beam current measurement during the specimen excitation. The apparatus allows the measurement of the CL intensity, the CL spectrum, or the CL intensity decay depending on the specimen temperature, or on a variety of excitation conditions, such as excitation energy, electron current (dose), or excitation duration. The apparatus abilities are demonstrated by an example of the CL measurements of the YAG:Ce single-crystal scintillator.
Permanent Link: http://hdl.handle.net/11104/0235310