Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains

0423862 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr
Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 329-330.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
Institutional support: RVO:68081731
Keywords : SLEEM * Crystallographic orientation * polycrystalline metal * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Scanning Low Energy Electron Microscopy (SLEEM) is a Scanning Electron Microscopy technique in which electrons of an arbitrarily low incident energy (103–100 eV) are used. It makes use of the cathode lens principle, allowing to preserve a very good image resolution even at the lowest incident electron energies.
Permanent Link: http://hdl.handle.net/11104/0229924