Algorithm for Analysis of a Data Cube of Electron Micrographs

0423860 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Knápek, Alexandr - Pokorná, Zuzana
Algorithm for Analysis of a Data Cube of Electron Micrographs.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 325-326.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : SLEEM * crystallographic orientation * grain boundary recognition
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique, which uses low energy electrons while providing very good image resolution. Reflectivity of very slow electrons in the range 0 30 eV can be correlated with the electronic structure of the material, aiming at determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to analyse the image signal in dependence of the beam energy as the third dimension. Crucial task is to detect grain boundaries in polycrystals. Recent algorithms, performing the task for the traditional EBSD method, are not able of correcting for artefacts connected with the specimen contamination.
Permanent Link: http://hdl.handle.net/11104/0229921