HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements

0423427 - FZÚ 2014 RIV FR eng C - Conference Paper (international conference)
Galtier, E. - Renner, Oldřich - Krouský, Eduard - Rosmej, F.
HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements.
IFSA 2011 - 7th International Conference on Inertial Fusion Sciences and Applications. Les Ulis Cedex A: E D P SCIENCES, 2013, s. 13002. EPJ Web of Conferences, vol. 59. ISBN 9782759810772. ISSN 2100-014X.
[International Conference on Inertial Fusion Sciences and Applications /7./ - IFSA 2011. Bordeaux (FR), 12.09.2011-16.09.2011]
R&D Projects: GA ČR GAP205/10/0814; GA MŠMT LM2010014
Institutional support: RVO:68378271
Keywords : laser-produced plasmas * X-ray spectroscopy * high-resolution instrumentation * spectral line profiles and shifts
Subject RIV: BL - Plasma and Gas Discharge Physics

New spectrometer based on the Johann configuration of cylindrically bent crystals was developed and tested. The instrument suits to detailed line shape and shift measurements of transitions originating from high intensity laser-matter interaction. Accurate motorized rotation stage provides a robust and fast way to position the main components in the desired geometrical configuration. By using a Charge Coupled Device as detector, the instrument can be operated in high repetition rate laser facilities. Test experiments at PALS kilo-joule laser facility, demonstrated a viability of the new alignment procedure concept.
Permanent Link: http://hdl.handle.net/11104/0229520