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Reflectivity of very low energy electrons from polycrystalline metal samples

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    0422680 - ÚPT 2014 CZ eng K - Conference Paper (Czech conference)
    Pokorná, Zuzana
    Reflectivity of very low energy electrons from polycrystalline metal samples.
    Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 9.
    [Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
    R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : eflectivity * very low energy electros * polyctystalline metal samples
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

    The reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies.
    Permanent Link: http://hdl.handle.net/11104/0229233

     
     
Number of the records: 1