Sensitization of Pr.sup.3+./sup. ions by Eu.sup.2+./sup. ions in CaF.sub.2./sub. thin films deposited by evaporation

0421650 - FZÚ 2014 RIV US eng J - Journal Article
Guille, A. - Pereira, A. - Bensalah-Ledoux, A. - Moine, B. - Novotný, Michal - Bulíř, Jiří - Fitl, Přemysl - Lančok, Ján
Sensitization of Pr³⁺ ions by Eu²⁺ ions in CaF₂ thin films deposited by evaporation.
Journal of Applied Physics. Roč. 114, č. 20 (2012), "203509-1"-"203509-4". ISSN 0021-8979. E-ISSN 1089-7550
R&D Projects: GA ČR(CZ) GAP108/11/1312; GA MŠMT(CZ) 7AMB12FR034
Grant - others:AVČR(CZ) M100101271
Institutional support: RVO:68378271
Keywords : doped calcium fluoride * down conversion * thin film * evaporation * photoluminescence
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.210, year: 2012

In the present article, we analyse the possibility of sensitizing the 3Pj levels of Pr3+ ion with Eu2+ ion in CaF2 thin film deposited by evaporation. Indeed, the forbidden nature of the 4f-4f transition of Pr3+ ion makes its absorption too weak for thin film applications, while materials doped with the Pr3+-Yb3+ couple are promising candidates for the achievement of efficient down-converter systems and could allow strong reduction of thermalization losses in silicon solar cells.
Permanent Link: http://hdl.handle.net/11104/0227942