Number of the records: 1  

Laser scanning confocal microscopy in materials engineering

  1. 1.
    0399477 - FZÚ 2014 RIV US eng C - Conference Paper (international conference)
    Tomáštík, J. - Šebestová, Hana - Čtvrtlík, R. - Schovánek, P.
    Laser scanning confocal microscopy in materials engineering.
    Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics /18./. Bellingham: SPIE, 2012 - (Peřina jr., J.; Nožka, L.; Hrabovský, M.; Senderáková, D.; Urbańczyk, W.). Proceedings of SPIE, 8697. ISBN 978-0-8194-9481-8. ISSN 0277-786X.
    [Czech-Polish-Slovak optical conference on wave and quantum aspects of contemporary optics /18./. Ostravice (CZ), 03.09.2012-07.09.2012]
    R&D Projects: GA TA ČR TA01010517
    Institutional research plan: CEZ:AV0Z10100522
    Keywords : laser scanning confocal microscopy * surface examination * 3D surface topography
    Subject RIV: BH - Optics, Masers, Lasers

    In materials engineering, we are often faced with a necessity to display the shape and morphology of studied surfaces. This is essential for surface evaluation of various components as well as for new materials research. Several imaging techniques are available for such purposes. One of the most appropriate of them is laser scanning confocal microscopy. The magnification range of this technique satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes. It overcomes the limitations of optical microscopy by better lateral resolution, ability to control the depth of field and possibility of high-resolution 3D imaging of relatively thick samples. Compared to the more advanced (and more expensive) scanning electron microscopes, laser scanning confocal microscopy has no special requirement for the sample preparation and there is also no need to measure in vacuum.
    Permanent Link: http://hdl.handle.net/11104/0226791

     
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.