Conductive atomic force microscopy of delicate nanostructures in torsional resonance mode

0390938 - FZÚ 2013 eng A - Abstract
Vetushka, Aliaksi - Fejfar, Antonín - Ledinský, Martin - Rezek, Bohuslav - Kočka, Jan
Conductive atomic force microscopy of delicate nanostructures in torsional resonance mode.
International Workshop on Scanning Probe Microscopy for Energy Applications /2./, Program and Abstracts. 2011.
[International Workshop on Scanning Probe Microscopy for Energy Applications /2./. 08.06.2011-10. 06. 2011, Mainz]
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT LC510
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : C-AFM * nanowires * TR-mode * TR-TUNA
Subject RIV: BM - Solid Matter Physics ; Magnetism

Conductive atomic force microscopy (C-AFM) technique requires scan of a sample in contact mode with applied normal force about 10-1000 nN, which may be too high for delicate samples, such as silicon nanowires, ZnO nanorods, carbon nanowalls etc. To overcome the limitations of the contact mode, we have successfully used the local conductivity measurements using the torsional resonance mode (TR-mode) for topography feedback of the AFM. In the TR-mode the tip oscillates laterally with amplitudes of only few nanometers in the near field of the sample surface that the tunneling of electrons between the tip and the sample is possible. The TR-mode is non-contact which allow to achieve minimum tip damage and thus to avoid artifacts due to the conductive layer abrasion. We illustrate the use of Torsional Resonance Tunneling AFM (TR-TUNA) for local conductivity measurement of delicate or elastic nanostructures.
Permanent Link: http://hdl.handle.net/11104/0219866