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Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods
- 1.0390810 - FZÚ 2013 RIV NL eng J - Journal Article
Toušek, J. - Toušková, J. - Remeš, Zdeněk - Čermák, Jan - Kousal, J. - Kindl, Dobroslav - Kuřitka, I.
Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods.
Chemical Physics Letters. Roč. 552, NOV (2012), s. 49-52. ISSN 0009-2614. E-ISSN 1873-4448
R&D Projects: GA ČR(CZ) GBP108/12/G108
Institutional research plan: CEZ:AV0Z10100521
Keywords : surface photovoltage * Kelvin probe force microscopy * conjugated polymers
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.145, year: 2012
Novelized method of the surface photovoltage (SPV) measurement convenient for evaluation of exciton diffusion length and thickness of the space charge region (SCR) in organic semiconductors is applied to poly[2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylene vinylene] (MEH-PPV) polymer. Exciton diffusion length and thickness of the SCR was found. The experiment is complemented by measurements of surface potential by the Kelvin probe force microscopy yielding the work function and concentration of free holes. The latter value is much lower than the concentration of ionized states determined from the thickness of the space charge region, which can be ascribed to the presence of traps.
Permanent Link: http://hdl.handle.net/11104/0219638
Number of the records: 1