Charged micro-patterns on nanocrystalline diamond are well defined by electrical current application

0390085 - FZÚ 2013 RIV CZ eng J - Journal Article
Verveniotis, Elisseos - Kromka, Alexander - Rezek, Bohuslav
Charged micro-patterns on nanocrystalline diamond are well defined by electrical current application.
Acta Universitatis Carolinae. Mathematica et Physica. Roč. 53, č. 2 (2012), s. 61-67. ISSN 0001-7140
R&D Projects: GA ČR GD202/09/H041; GA ČR(CZ) GBP108/12/G108; GA ČR GAP108/12/0996
Institutional research plan: CEZ:AV0Z10100521
Keywords : nanocrystalline diamond * thin films * electrostatic charging * AFM * KFM
Subject RIV: BM - Solid Matter Physics ; Magnetism

We apply atomic force microscope for local electrostatic charging of oxygen-terminated nanocrystalline diamond (NCD) thin films deposited on silicon by regulated electrical current application. The NCD films have sub-100 nm thickness and 60% relative sp2 phase content. The charge is injected by constant current application. Induced electrical potential contrast is then evaluated by Kelvin Force Microscopy (KFM) which shows welldefined homogeneous features and a sub-linear increase of surface potential with increase in electrical current. We suggest limitation by field-induced detrapping.
Permanent Link: http://hdl.handle.net/11104/0218982