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Conductive atomic force microscopy on carbon nanowalls
- 1.0389053 - FZÚ 2013 RIV NL eng J - Journal Article
Vetushka, Aliaksi - Itoh, T. - Nakanishi, Y. - Fejfar, Antonín - Nonomura, S. - Ledinský, Martin - Kočka, Jan
Conductive atomic force microscopy on carbon nanowalls.
Journal of Non-Crystalline Solids. Roč. 358, č. 17 (2012), s. 2545-2547. ISSN 0022-3093. E-ISSN 1873-4812
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT 7E10061
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : carbon nanowalls * conductive atomic force microscopy * torsion resonance mode * nanostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.597, year: 2012
The nanostructure of carbon nanowalls (CNWs) was investigated by Torsion Resonance (TR) Atomic Force Microscopy (AFM). In this dynamic non-contact imaging mode a cantilever oscillates torsionally and the amplitude of oscillations is used for the AFM feedback. The technique includes benefits of the semicontact (tapping) mode and at the same time allows one to measure the local conductivity. Moreover, the phase signal is much stronger and fine structures of the CNWs were observed. We also present a comparison of the results obtained by TR, tapping, and contact modes.
Permanent Link: http://hdl.handle.net/11104/0217956
Number of the records: 1