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Characterization of the local crystallinity via reflectance of very slow electrons
- 1.0384097 - ÚPT 2013 RIV US eng J - Journal Article
Pokorná, Zuzana - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Characterization of the local crystallinity via reflectance of very slow electrons.
Applied Physics Letters. Roč. 100, č. 26 (2012), 261602:1-4. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very slow electrons * crystal system * electron backscatter diffraction analyses
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.794, year: 2012
The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e. g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.
Permanent Link: http://hdl.handle.net/11104/0213844
Number of the records: 1