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A method of imaging ultrathin foils with very low energy electrons
- 1.0383741 - ÚPT 2013 RIV NL eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
A method of imaging ultrathin foils with very low energy electrons.
Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.470, year: 2012
We demonstrate the possibility to examine the free-standing foils of thicknesses in units of nm in the scanning low energy electron microscope, using both reflected and transmitted electrons. Very high contrast has been obtained in dependence on the thickness and structure of the foil. A contribution of secondary electrons to the forward scattered electron signal is discussed and a way of suppressing it is presented. Examples of reflected, total transmitted and dark field transmitted electron signal for two graphene-like samples are shown. Dependence of the transmitted signal on the electron energy is observed.
Permanent Link: http://hdl.handle.net/11104/0213588
Number of the records: 1