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Applications of the Scanning Low Energy Electron Microscope
- 1.0379913 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
Applications of the Scanning Low Energy Electron Microscope.
Microscopy and Microanalysis. Roč. 18, S2 (2012), s. 996-997. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscope * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scale down to units of electronvolts.
Permanent Link: http://hdl.handle.net/11104/0210765
Number of the records: 1