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Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion

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    0379852 - BFÚ 2013 RIV NL eng J - Journal Article
    Penttinen, N. - Hasoň, Stanislav - Silvennoinen, M. - Joska, L. - Silvennoinen, R.
    Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion.
    Optics Communications. Roč. 285, č. 6 (2012), s. 965-968. ISSN 0030-4018. E-ISSN 1873-0310
    Grant - others:GA ČR(CZ) GAP108/10/1782
    Program: GA
    Institutional research plan: CEZ:AV0Z50040507; CEZ:AV0Z50040702
    Keywords : permittivity * XPS titanium * diffractive optical element-based sensor
    Subject RIV: BO - Biophysics
    Impact factor: 1.438, year: 2012

    A reflection models from a XPS characterized titanium surface were calculated using Bruggeman's model. These models were tested in a diffractive optical element-based sensor measurements, while the samples were immersed in a phosphate buffered saline solution. A second reflectance model of a material thickness on a titanium surface was conducted, to further evaluate the reflectance information gathered with diffractive optical element-based sensor.
    Permanent Link: http://hdl.handle.net/11104/0210718

     
     
Number of the records: 1  

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