Number of the records: 1
Characterization of electrophoretic suspension for thin polymer film deposition
- 1.0376417 - ÚMCH 2013 RIV GB eng J - Journal Article
Mladenova, D. - Weiter, M. - Štěpánek, Petr - Ouzzane, I. - Vala, M. - Sinigersky, V. - Zhivkov, I.
Characterization of electrophoretic suspension for thin polymer film deposition.
Journal of Physics: Conference Series. Roč. 356, č. 1 (2012), s. 012040. ISSN 1742-6588. E-ISSN 1742-6596.
[International Summer School on Vacuum, Electron, and Ion Technologies /17./ - VEIT 2011. Sunny Beach, 19.09.2011-23.09.2011]
R&D Projects: GA MŠMT ME09059
Institutional research plan: CEZ:AV0Z40500505
Keywords : polyelectrolyte * dielectric constant * dynamic light scattering
Subject RIV: CF - Physical ; Theoretical Chemistry
The optical absorption and fluorescence spectra of poly [2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions show clearly distinguishable differences (e.g., peak broadening and shifting), which could be used for characterization of suspensions with different acetonitrile content. The dynamic light scattering (DLS) measurement of the suspensions prepared showed a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft, a contactless optical profilometry techique based on chromatic aberration was used to measure their thickness. AFM imaging of spin coated and EPD films revealed film roughness of 20÷40 nm and 40÷80 nm, respectively. The EPD film roughness seems to be less than the suspension particle size obtained by DLS, probably due to the partial film dissolving by the toluene present in the suspension.
Permanent Link: http://hdl.handle.net/11104/0208823
Number of the records: 1