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Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy
- 1.0375356 - FZÚ 2012 JP eng A - Abstract
Vetushka, Aliaksi - Itoh, T. - Fejfar, Antonín - Ledinský, Martin - Rezek, Bohuslav - Kočka, Jan
Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy.
ICANS 24. Program and Abstracts Book. Nara, 2011. s. 309.
[International Conference on Amorphous and Nanocrystalline Semiconductors /24./ (ICANS 24). 21.08.2011-26.08.2011, Nara]
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT LC510
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : carbon nanowalls * conductive atomic force microscopy * torsion resonance mode * nanostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism
We report results of Torsional Resonance Tunneling AFM (TR-TUNA) for local conductivity measurement of: carbon nanowalls, ZnO nanorods, Si nanowires.
Permanent Link: http://hdl.handle.net/11104/0208031
Number of the records: 1