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An in-vacuum diffractometer for resonant elastic soft x-ray scattering

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    0375044 - FZÚ 2012 RIV US eng J - Journal Article
    Hawthorn, D.G. - He, F. - Venema, L. - Davis, H. - Achkar, A.J. - Zhang, J. - Sutarto, R. - Wadati, H. - Radi, A. - Wilson, T. - Wright, G. - Shen, K.M. - Geck, J. - Zhang, H. - Novák, Vít - Sawatzky, G.A.
    An in-vacuum diffractometer for resonant elastic soft x-ray scattering.
    Review of Scientific Instruments. Roč. 82, č. 7 (2011), 073104/1-073104/8. ISSN 0034-6748. E-ISSN 1089-7623
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : gallium arsenide * lanthanum compounds * manganese compounds * neodymium * reflectivity * semiconductor thin films * strontium compounds * X-ray diffraction
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.367, year: 2011

    We describe the design, construction, and performance of a 4-circle in-vacuum diffractometer for resonant elastic soft x-ray scattering. Example measurements of diffraction and reflectivity in Nd-doped (La,Sr)2CuO4 and thin film (Ga,Mn)As are shown.
    Permanent Link: http://hdl.handle.net/11104/0207811

     
     
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