Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences

0370863 - ÚJF 2013 RIV NL eng J - Journal Article
Malinský, Petr - Macková, Anna - Hnatowicz, Vladimír - Khaibullin, R. I. - Valeev, V. F. - Slepička, P. - Svorcik, V. - Šlouf, Miroslav - Peřina, Vratislav
Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 272, č. 2 (2012), s. 396-399. ISSN 0168-583X. E-ISSN 1872-9584.
[17th international conference on ion beam modification of materials. Montreal, 22.08.2010-27.08.2010]
R&D Projects: GA ČR GA106/09/0125; GA MŠMT(CZ) LC06041; GA AV ČR(CZ) KAN400480701
Institutional research plan: CEZ:AV0Z10480505; CEZ:AV0Z40500505
Keywords : Ni ion implantation * Polymers * Depth profiles * RBS * TEM * AFM
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 1.266, year: 2012

Polyimide, polyetheretherketone and polyethyleneterephthalate were implanted with 40 keV Ni+ ions at RT to the fluences (0.25–1.5) × 1017 cm−2. Then some of the samples were annealed at the temperatures close to the polymer glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree reasonably with those simulated using TRYDIN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. The changes in the polymer sheet resistance of the implanted and annealed samples were measured by standard two-point technique.
Permanent Link: http://hdl.handle.net/11104/0204544