Number of the records: 1
Characterization of organosilicon thin films prepared in atmospheric pressure Towsend-like discharge
- 1.0367693 - ÚJF 2012 GB eng A - Abstract
Trunec, D. - Zajíčková, L. - Buršíková, V. - Peřina, Vratislav - Studnička, F. - Sťahel, P. - Prysiazhnyi, V. - Mikšová, Romana
Characterization of organosilicon thin films prepared in atmospheric pressure Towsend-like discharge.
[Characterization of organosilicon thin films prepared in atmospheric pressure Towsend-like discharge.]
Abstract book, 19th International conference on Ion beam analysis. Cambridge: IOP, Institute of physics, 2009.
[19th International conference on Ion beam analysis. 07.09.2009-11.09.2009, Cambridge]
Institutional research plan: CEZ:AV0Z10480505
Keywords : dieletric barrier discharges * ERDA * FTIR spectroscopy * XPS
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Permanent Link: http://hdl.handle.net/11104/0202277
Number of the records: 1