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Scanning probe microscopy on organic heterostructures for photovoltaics
- 1.0356027 - FZÚ 2011 JP eng C - Conference Paper (international conference)
Čermák, Jan - Rezek, Bohuslav - Ledinský, Martin - Cimrová, Věra - Fejfar, Antonín
Scanning probe microscopy on organic heterostructures for photovoltaics.
Proceedings of The Third International Forum on Multidisciplinary Education and Research for Energy Science. Tokyo: Tokyo Institute of Technology Global COE Program, 2010 - (Hirai, S.; Maruyama, T.), s. 167-168. ISBN N.
[International Forum on Multidisciplinary Education and Research for Energy Science /3./. Ishigaki, Okinawa (JP), 09.12.2010-14.12.2010]
Institutional research plan: CEZ:AV0Z10100521; CEZ:AV0Z40500505
Keywords : probe miscroscopic techniques * organic heterostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism
Various scanning probe microscopic techniques were applied to organic heterostructures. The heterostructures are donor-acceptor system for photovoltaics. It has been proven, that correlation of atomic force microscopy (AFM), Kelvin force microscopy (KFM), mapping of micro-Raman scattering and current-sensing AFM can identify problematic areas of the heterostructures.
Permanent Link: http://hdl.handle.net/11104/0194656
Number of the records: 1