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Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
- 1.0354945 - FZÚ 2011 RIV CH eng J - Journal Article
Verveniotis, Elisseos - Rezek, Bohuslav - Šípek, Emil - Stuchlík, Jiří - Kočka, Jan
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon.
Thin Solid Films. Roč. 518, č. 21 (2010), s. 5965-5970. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GD202/09/H041; GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Institutional research plan: CEZ:AV0Z10100521
Keywords : amorphous materials * atomic force microscopy (AFM) * conductivity * crystallization * nanostructures * silicon * nickel
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.909, year: 2010
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions.
Permanent Link: http://hdl.handle.net/11104/0193834
Number of the records: 1