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Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization
- 1.0353670 - FZÚ 2011 RIV JP eng J - Journal Article
Yanagida, T. - Fujimoto, Y. - Yoshikawa, A. - Yokota, Y. - Kamada, K. - Pejchal, Jan - Chani, V. - Kawaguchi, N. - Fukuda, K. - Uchiyama, K. - Mori, K. - Kitano, K. - Nikl, Martin
Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization.
Applied Physics Express. Roč. 3, č. 5 (2010), 056202/1-056202/3. ISSN 1882-0778. E-ISSN 1882-0786
Institutional research plan: CEZ:AV0Z10100521
Keywords : scintillation decay * streak camera * picosecond X-ray pulse * BaF2
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.747, year: 2010
To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from VUV to near infrared region (110-900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator.
Permanent Link: http://hdl.handle.net/11104/0192847
Number of the records: 1