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Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science
- 1.0352510 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Mizutani, M. - Narukawa, Y. - Müllerová, Ilona - Frank, Luděk
Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science.
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 77-78. ISBN 978-4-9903248-2-7.
[JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * AZ 91 * AZ 96 * UFG Al * matal matrix composite materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Progress in materials research is inseparably connected to the development of new analytical methods, which make it possible to examine. The aging hardness the structures of materials at high spatial resolution and sensitivity. A very promising technique for study the microstructure of advanced materials is the scanning low energy electron microscopy (SLEEM).
Permanent Link: http://hdl.handle.net/11104/0192002
Number of the records: 1