Influence of the clusters on the Bi LMIS properties

0352425 - ÚPT 2011 SG eng A - Abstract
Radlička, Tomáš - Lencová, Bohumila
Influence of the clusters on the Bi LMIS properties.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 44-45.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
Grant - others:EC 7FP(XE) NMP4-SE-2008-200613
Source of funding: R - Framework programmes of European Commission
Keywords : liquid–metal ion sources * discrete coulomb interactions * clusters
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

For low emission currents around 1μA or below, liquid–metal ion sources (LMIS) produce fine optically bright ion beams. In SIMS the sample is bombarded by ions with energies typically 10 – 40keV to produce secondary ions. The properties of the LMIS are strongly limited by the effect of the Discrete Coulomb Interactions (DCI) in the vicinity of the tip. The DCI increase the energy width (Boersh effect) and decrease the brightness of the source due to the trajectory displacement effect. These effects we have already studied for Ga LMIS at 1 .mu.A emission current. The Ga ion beam contains mostly only Ga+ ions and some high resolution FIBs can ever use single isotope of Ga.
Permanent Link: http://hdl.handle.net/11104/0191932