Determination of analytical expansion from numerical field data

0350850 - ÚPT 2011 RIV NL eng J - Journal Article
Radlička, Tomáš - Lencová, Bohumila
Determination of analytical expansion from numerical field data.
Ultramicroscopy. Roč. 110, č. 9 (2010), s. 1198-1204. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optics * aberrations * differential algebra method * axial field derivatives
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.061, year: 2010

We introduce a method of calculation of the analytical expansion of the field near the axis that is based on an application of Green's theorem. The approach is demonstrated on an example of a round electrostatic unipotential lens with field computed by the finite-element method and results are compared to methods of Hermite polynomials and wavelet transformation which are used in electron optics. The work is motivated by application to calculations of aberration coefficients where the high order axial field derivatives must be known.
Permanent Link: http://hdl.handle.net/11104/0190740