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Quantitative phase analysis of model painting layers : A comparasion of X-ray micro-diffraction with conventional transmission and reflection geometries

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    0346294 - ÚACH 2011 DK eng A - Abstract
    Bezdička, Petr - Kotulanová, Eva - Klementová, Mariana
    Quantitative phase analysis of model painting layers : A comparasion of X-ray micro-diffraction with conventional transmission and reflection geometries.
    Acta Crystallographica Section A. Oxford Blackwell. Roč. 65, suppl - abstracts (2009), s. 191. ISSN 0108-7673. E-ISSN 2053-2733.
    [European Crystalographic Meeting /25./. 16.08.2009-21.08.2009, Istanbul]
    Institutional research plan: CEZ:AV0Z40320502
    Keywords : micro-diffraction * quantitative phase analysis * art-works
    Subject RIV: CA - Inorganic Chemistry

    Detection limits of micro-diffraction were studied and it was revealed that approximately 5 weight percent of phase in a mixture is needed both for reliable qualitative and quantitative analysis.
    Permanent Link: http://hdl.handle.net/11104/0187362

     
     
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