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Relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure

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    0336986 - ÚFM 2010 RIV RO eng A - Abstract
    Stoica, A. - Buršíková, V. - Niculescu, A. - Vladoiu, R. - Buršík, Jiří - Klapetek, P. - Bláhová, O.
    Relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure.
    International Balkan Workshop on Applied Physics. Constanta: Ovidius University Press, 2008. s. 111-111. ISBN 978-973-614-415-8.
    [International Balkan Workshop on Apllied Physics /7./. 05.07.2006-07.07.2006, Constanta]
    Institutional research plan: CEZ:AV0Z20410507
    Keywords : carbon thin films * PECVD * TVA
    Subject RIV: BL - Plasma and Gas Discharge Physics

    In this work, we studied the relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure.
    Permanent Link: http://hdl.handle.net/11104/0181090

     
     
Number of the records: 1  

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