Number of the records: 1
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods
- 1.0315079 DE BXXS
Luysberg, M. (ed.) - Tillmann, K. (ed.) - Weirich, T. (ed.)
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods.
Berlin: Springer, 2008. ISBN 978-3-540-85154-7
Number of the records: 1